Methods for Gibbs triple junction excess determination: Ti segregation in CoSi2 thin film
- 1 September 2020
- journal article
- research article
- Published by Springer Science and Business Media LLC in Journal of Materials Science
- Vol. 55 (27), 13177-13192
- https://doi.org/10.1007/s10853-020-04856-4
Abstract
No abstract availableFunding Information
- Investissements d’Avenir A*MIDEX (ANR-11-IDEX-0001-02)
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