Current tuned slotted Y‐branch laser for wafer thickness measurements with THz radiation
Open Access
- 12 September 2021
- journal article
- research article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 57 (24), 936-938
- https://doi.org/10.1049/ell2.12314
Abstract
A slotted Y-branch laser diode that emits two spectral modes at a difference frequency of about 1 THz is investigated in the context of photonic based cw-THz measurements. The beating frequency of the emitted laser light can be tuned by ±10.5 GHz around 1 THz by changing the applied laser current, which allows for potentially fast measurements. A second spectral window of ±6.5 GHz was found at 850 GHz. Pointwise scanning of the difference frequency is demonstrated with thickness determination of HRFZ-Si wafer samples as a possible application scenario.Keywords
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