Detection of defects in atomic-resolution images of materials using cycle analysis
Open Access
- 30 March 2020
- journal article
- research article
- Published by Springer Science and Business Media LLC in Advanced Structural and Chemical Imaging
- Vol. 6 (1), 1-9
- https://doi.org/10.1186/s40679-020-00070-x
Abstract
No abstract availableKeywords
This publication has 28 references indexed in Scilit:
- Atomically localized plasmon enhancement in monolayer grapheneNature Nanotechnology, 2012
- Identification of active atomic defects in a monolayered tungsten disulphide nanoribbonNature Communications, 2011
- Mapping Octahedral Tilts and Polarization Across a Domain Wall in BiFeO3 from Z-Contrast Scanning Transmission Electron Microscopy Image Atomic Column Shape AnalysisACS Nano, 2010
- Atom-by-atom structural and chemical analysis by annular dark-field electron microscopyNature, 2010
- Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopyUltramicroscopy, 2009
- Recent developments in catalysis using nanostructured materialsApplied Catalysis A: General, 2009
- Doping a Mott insulator: Physics of high-temperature superconductivityReviews of Modern Physics, 2006
- Disorder-driven non-Fermi liquid behaviour of correlated electronsReports on Progress in Physics, 2005
- The Metal-Insulator Transition in Correlated Disordered SystemsScience, 1996
- Two algorithms for constructing a Delaunay triangulationInternational Journal of Parallel Programming, 1980