Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials
Open Access
- 11 January 2021
- Vol. 4 (1), 18-30
- https://doi.org/10.3390/surfaces4010004
Abstract
We present here a method for the quantitative prediction of the spectroscopic specular reflectivity line-shape in anisotropic layered media. The method is based on a 4 × 4 matrix formalism and on the simulation from the first principles (through density functional theory—DFT) of the anisotropic absorption cross-section. The approach was used to simulate the reflectivity at the oxygen K-edge of a 3,4,9,10-perylene-tetracarboxylic dianhydride (PTCDA) thin film on Au(111). The effect of film thickness, orientation of the molecules, and grazing incidence angle were considered. The simulation results were compared to the experiment, permitting us to derive information on the film geometry, thickness, and morphology, as well as the electronic structure.Keywords
This publication has 25 references indexed in Scilit:
- Quantitative resonant soft x-ray reflectivity from an organic semiconductor single crystalThe Journal of Chemical Physics, 2019
- 3D reconstruction of pentacene structural organization in top-contact OTFTs via resonant soft X-ray reflectivityApplied Physics Letters, 2018
- Quantitative resonant soft x-ray reflectivity of ultrathin anisotropic organic layers: Simulation and experiment of PTCDA on AuThe Journal of Chemical Physics, 2016
- Structural and electronic properties of anisotropic ultrathin organic films from dichroic resonant soft x-ray reflectivityPhysical Review B, 2014
- High-order laser harmonics and synchrotron study of transition metalsedgesPhysical Review B, 2006
- General analytical treatment of optics in layered structures: Application to magneto-opticsPhysical Review B, 2001
- Dielectric properties of the Si(111)2×1 surface: Optical constants and the energy-loss spectrumPhysical Review B, 1983
- Surface states in Si(111)2×1 and Ge(111)2×1 by optical reflectivitySolid State Communications, 1980
- Optical Detection of Surface States on Cleaved (111) Surfaces of GePhysical Review Letters, 1968
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954