Nanometer Thick Diffused Hafnium and Titanium Oxide Light Sensing Film Structures
Open Access
- 1 January 2017
- journal article
- Published by Scientific Research Publishing, Inc. in World Journal of Condensed Matter Physics
- Vol. 07 (01), 36-45
- https://doi.org/10.4236/wjcmp.2017.71004
Abstract
We examine 10 nm thick film structures containing either Hf or Ti sandwiched between two respective oxide layers. The layers are deposited onto heated substrates to create a diffusion region. We observe a high degree of light sensitivity of the electric current through the film thickness for one polarity of an applied voltage. For the other polarity, the current is not affected by the light. We explain the observed phenomenology using the single-particle model based on the existence of interface states on the metal-oxide interfaces.Keywords
This publication has 1 reference indexed in Scilit:
- Watch out for the lack of oxygenNature Materials, 2007