Ghost Imaging with Deep Learning for Position Mapping of Weakly Scattered Light Source
Open Access
- 4 January 2021
- journal article
- research article
- Published by Springer Science and Business Media LLC in Nanomanufacturing and Metrology
- Vol. 4 (1), 37-45
- https://doi.org/10.1007/s41871-020-00085-0
Abstract
We propose ghost imaging (GI) with deep learning to improve detection speed. GI, which uses an illumination light with random patterns and a single-pixel detector, is correlation-based and thus suitable for detecting weak light. However, its detection time is too long for practical inspection. To overcome this problem, we applied a convolutional neural network that was constructed based on a classification of the causes of ghost image degradation. A feasibility experiment showed that when using a digital mirror device projector and a photodiode, the proposed method improved the quality of ghost images.Keywords
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