Heterostructure Device Based on Graphene Oxide/TiO2/n-Si for Optoelectronic Applications
- 1 February 2021
- journal article
- research article
- Published by The Electrochemical Society in ECS Journal of Solid State Science and Technology
- Vol. 10 (2), 021002
- https://doi.org/10.1149/2162-8777/abe1d9
Abstract
We produced a graphene oxide with good conductivity by a novel method that saves cost and time as illustrated in the structure Au/GO/TiO2/Si/Al. The GO was synthesized by burning polyvinyl alcohol at 300 °C on the TiO2/n-Si surface producing a conductive graphene oxide that is considered a new advantage of this technique. The Au/GO/TiO2/n-Si/Al structure is manufactured using the spin coating process. The XRD and SEM identified the samples’ structure and surface topography. In a frequency range from 10 kHz to 20 MHz, the electrical and dielectric parameters of the synthetic Schottky diodes were obtained from capacitance/conductance-voltage. The diagram of real and imaginary parts of the impedance (Z′, Z″), col-col, and their variation with temperatures, voltage, and frequency were also discussed. A comparison of electrical parameters such as ideality factor (n), series resistance (Rs), barrier height (Φb) based on traditional, Cheung, and Norde methods was investigated. The oxide layer thickness values (dox), the density distribution (Nss), the maximum admittance (Ym), the maximum electric field (Em), the depletion layer width (Wd), and ΔΦb (eV) were investigated using the C2 − V relationship. As the frequency increases, the Φb(C−V) increases, while the concentration of donor atoms (ND) decreases. The surface states (Nss) voltage-dependent profile was calculated and evaluated.Keywords
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