Extracting bulk defect parameters in silicon wafers using machine learning models
Open Access
- 18 September 2020
- journal article
- research article
- Published by Springer Science and Business Media LLC in npj Computational Materials
- Vol. 6 (1), 1-8
- https://doi.org/10.1038/s41524-020-00410-7
Abstract
No abstract availableFunding Information
- Australian Renewable Energy Agency (2017/RND001, 2017/RND017, 2017/RND001, 2017/RND017)
- Australian Centre for Advanced Photovoltaics (RG200768-G)
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