Development of on-chip pattern processing in event-driven SOI pixel detector for X-ray astronomy with background rejection purpose

Abstract

This paper reports on the development of on-chip pattern processing in the event-driven silicon-on-insulator pixel detector for X-ray astronomy with background rejection purpose. X-ray charge-coupled device (CCD) detectors, well-established pixel detectors used in this field, has proven that classification of detected events considering their spatial pattern is effective for particle background rejection. Based on the current architecture of our device and from the CCD images obtained in space, we first established a design concept and algorithm of the pattern processor to be implemented. Then, we developed a new device, including a prototype pattern-processing circuit. Experiments using X-ray and beta-ray radioisotopes demonstrated that the pattern processor properly works as expected, and the particle background rejection is realized in an on-chip fashion. This function is useful, especially in a limited-resource system such as the CubeSat.