In-process measurement of a keyhole using a low-coherence interferometer with a high repetition rate
- 22 September 2021
- journal article
- research article
- Published by Optica Publishing Group in Optics Express
- Vol. 29 (20), 32169-+
- https://doi.org/10.1364/oe.435139
Abstract
The shape of an instance hole (keyhole) created via a high-power laser was measured using a low-coherence interferometer with the following parameters: repetition rate, 10 MHz; center wavelength, 1550 nm; absolute spatial resolution, 10 µm; and measurement range, 5 mm. The keyhole was created on a 3-mm-thick stainless-steel plate using a high-power laser with 8-kW peak power and 1070-nm center wavelength. The cross-sectional area of the keyhole was measured to be 0.42 mm × 0.78 mm (width × depth) using the interferometer, and its side dimension was 0.46 mm × 0.78 mm (width × depth).Funding Information
- Adaptable and Seamless Technology Transfer Program through Target-Driven R and D (JPMJTR192F)
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