Indium–Gallium–Zinc Oxide Thin-Film Transistor-Based Scan Driver Circuit Using Separate Driving Structure for Multiple Output Signals

This article proposes a scan driver circuit based on indium–gallium–zinc oxide (IGZO) thin-film transistors (TFTs) for multiple output signals. The proposed circuit could generate two overlapped output signals using a separate driving structure. The separate driving structure enabled the control nodes of each output signal to have a sufficiently high voltage during the output period. Consequently, the proposed circuit stably operated with the threshold voltage ( $\textit{V}_{\text{TH}}\text{)}$ varying from $-$ 3 to 4 V in the circuit simulation. The proposed scan driver circuit could reduce the circuit area because a single stage could output two output signals for two adjacent scan lines. Furthermore, the fabricated scan driver circuit exhibited a stable operation with multiple overlapped signals. Consequently, the proposed IGZO TFT-based scan driver circuit showed a stable circuit operation with multiple output signals through the separate driving structure.
Funding Information
  • Technology Innovation Program (20016317)
  • the On-Panel Circuit Integration and Driving System Technology for 1270 ppi Low-Power Organic Light-Emitting Diode (OLED) Display Based on Oxide Semiconductor
  • the Ministry of Trade, Industry and Energy (MOTIE), South Korea
  • National Research Foundation of Korea (NRF) funded by the Korean Government (NRF-2022M3D1A2083618)

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