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Result: 1
(searched for:
doi:10.1109/tc.2021.3095657
)
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A differential OTP memory based highly unique and reliable PUF at 180 nm technology node
P. Malviya, S. Sadana, A. Lele, K. Priyadarshi, A. Sharma, A. Naik, L. Bandhu, A. Bende, S. Tsundus, S. Kumar, et al.
Published: 1 February 2022
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Elsevier BV
Journal:
Solid-State Electronics
References: 9
,
Cited by 2
Solid-State Electronics, Volume 188;
https://doi.org/10.1016/j.sse.2021.108207
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