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(searched for: doi:10.14196/sjr.v7i1.2501)
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Xinbo Huang, Jie Hu, Yongcan Zhu, Zhipeng Xue, Yan Zhou, Hongxia Wu
IET Science, Measurement & Technology, Volume 14, pp 817-823; doi:10.1049/iet-smt.2019.0553

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