ReRAM-Based Pseudo-True Random Number Generator With High Throughput and Unpredictability Characteristics
Published: 19 February 2021
IEEE Transactions on Electron Devices , Volume 68, pp 1593-1597; https://doi.org/10.1109/ted.2021.3057028
Abstract: We report an ReRAM-based pseudo-true random number generator (RNG) which can significantly improve the security feature of e-ReRAM chips at a very low cost. Combining the true randomness from stochastic behavior of ReRAM and the high output speed from a modified linear feedback shift register (LFSR), the proposed architecture can provide ultrahigh throughput random sequence following system clocks from several Mbit/sec to tens of Gbit/sec. The highly reliable, unpredictable, and unrepeatable ReRAM-based pseudo-true RNG circuit can pass NIST SP800-22 randomness tests at a high score. It is suitable for secure IoT and 5G applications.
Keywords: NIST / Throughput / Generators / Entropy / Arrays / Random number generation / Linear feedback shift registers
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