Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II
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- 5 October 2017
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Synchrotron Radiation
- Vol. 24 (6), 1113-1119
- https://doi.org/10.1107/s1600577517011183
Abstract
A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.Keywords
Funding Information
- US Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory (DE-SC0012704)
- The Innovation and Application of Nanoscience Thematic Program and the Academia Sinica Thematic Project