Author Affiliations 1Department of Radioelectronics and Applied Informatics, Moscow Institute of Physics and Technology, Russia 2Laboratory of Multimedia Systems and Technologies, Moscow Institute of Physics and Technology, Russia Received: September 29, 2020 | Published: October 05, 2020 Corresponding author: Valeriy A Astapenko, Department of Radioelectronics and Applied Informatics, Laboratory of Multimedia Systems and Technologies, Moscow Institute of Physics and Technology, Russia DOI: 10.26717/BJSTR.2020.30.005029 The paper deals with the influence of the geometric shape of a semiconductor nanoparticle on the sensitivity of an optical plasmon sensor built on its basis. An ellipsoidal Indium-Tin Oxide (ITO) nanoparticle is considered as an example. It is shown that the sensitivity of such a sensor is proportional to the semiaxis dimension of the ellipsoid along which the polarization of the incident radiation is directed. Keywords: Semiconductor nanoparticles; Localized surface plasmon resonance (SPR); absorbtion cross section; optical plasmonic sensor