PUF-based Secure Test Wrapper Design for Network-on-Chip
- 27 June 2022
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
Abstract
Without secure wrappers, it is impossible to protect the integrity of embedded IP cores for NoC-based SoC. This paper describes an IEEE 1500 compatible secure test wrapper NoC based on low-cost PUF circuit. The original key generated by LFSR is encrypted into a stream cipher by the PUF module, and the input key string should be equal to this cryptograph unless the wrapper is locked, which provides effective on-line authentication.Keywords
This publication has 12 references indexed in Scilit:
- Physical Unclonable Functions and Applications: A TutorialProceedings of the IEEE, 2014
- Novel Core Test Wrapper Design Supporting Multi-mode Testing of NoC-based SoCInternational Journal of Control and Automation, 2013
- PUF-based secure test wrapper design for cryptographic SoC testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2012
- A Secure Test Wrapper Design Against Internal and Boundary Scan Attacks for Embedded CoresIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2010
- Improving the quality of ring oscillator PUFs on FPGAsPublished by Association for Computing Machinery (ACM) ,2010
- An Efficient Secure Scan Design for an SoC Embedding AES CorePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2008
- Securing Designs against Scan-Based Side-Channel AttacksIEEE Transactions on Dependable and Secure Computing, 2007
- Secure Scan: A Design-for-Test Architecture for Crypto ChipsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006
- A Stream Cipher Proposal: Grain-128Published by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- Scan design and secure chip [secure IC testing]Published by Institute of Electrical and Electronics Engineers (IEEE) ,2004