Tuning structural, electrical, and THz optical properties of VxOy films with W-doping
- 26 January 2022
- journal article
- research article
- Published by Elsevier BV in Journal of Alloys and Compounds
- Vol. 903, 163922
- https://doi.org/10.1016/j.jallcom.2022.163922
Abstract
No abstract availableKeywords
This publication has 39 references indexed in Scilit:
- Microstructures and thermochromic properties of tungsten doped vanadium oxide film prepared by using VOX–W–VOX sandwich structureMaterials Science and Engineering B, 2011
- Nano-vanadium oxide thin films in mixed phase for microbolometer applicationsJournal of Physics D: Applied Physics, 2008
- Properties of Electrical Conductivity of Amorphous Tungsten-Doped Vanadium Oxide for Uncooled MicrobolometersSolid State Phenomena, 2007
- An XPS study on the surface reduction of V2O5(001) induced by Ar+ ion bombardmentSurface Science, 2006
- Thin films of vanadium oxide grown on vanadium metal: oxidation conditions to produce V2O5 films for Li-intercalation applications and characterisation by XPS, AFM, RBS/NRASurface and Interface Analysis, 2005
- Fabrication and characterization of bolometric oxide thin film based on vanadium–tungsten alloySensors and Actuators A: Physical, 2005
- Characterization of uncooled bolometer with vanadium tungsten oxide infrared active layerSensors and Actuators A: Physical, 2005
- Determination of the V2p XPS binding energies for different vanadium oxidation states (V5+ to V0+)Journal of Electron Spectroscopy and Related Phenomena, 2004
- Mixed-valence vanadium oxides studied by XPSSurface Science, 2000
- Conductivity of Superconducting Films for Photon Energies between 0.3 andPhysical Review B, 1957