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A Survey on Security Threats and Countermeasures in IEEE Test Standards
Emanuele Valea,
Mathieu Da Silva,
Giorgio Di Natale
,
Marie-Lise Flottes
,
Bruno Rouzeyre
Published: 13 February 2019
by
Institute of Electrical and Electronics Engineers (IEEE)
in
IEEE Design & Test
IEEE Design & Test
, Volume 36, pp 95-116;
https://doi.org/10.1109/mdat.2019.2899064
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