THz-Enhanced DC Ultrafast Electron Diffractometer
Open Access
- 1 January 2021
- journal article
- Published by American Association for the Advancement of Science (AAAS) in Ultrafast Science
Abstract
Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of 180fs (FWHM) with 10,000 electrons/pulse at a 1kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.Keywords
Funding Information
- Gordon and Betty Moore Foundation (GBMF4744)
- Deutsche Forschungsgemeinschaft (KA908-12/1, 390715994)
- Synergy Grant AXSIS (609920)
- Seventh Framework Programme (FP7/2007-2013)
- H2020 European Research Council
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