Bizarre artefacts in transmission electron microscopy preparation and observation of geological samples
- 20 December 2019
- journal article
- research article
- Published by Schweizerbart in European Journal of Mineralogy
- Vol. 31 (5-6), 857-873
- https://doi.org/10.1127/ejm/2019/0031-2893
Abstract
Several artefacts occurring during TEM sample preparation by ion-milling and observation, which cannot be straightforwardly discerned from genuine properties of the sample, are presented and discussed, with the aim to warn unexperienced microscopists against misinterpretation of TEM data. The cases presented here span from typical material sputtering and redeposition during ion-milling sample preparation, or sample decomposition under the electron beam, to more exotic cases of sample recrystallization during observation or during storage within the grid box. Overall, 15 different case studies, categorized among artefacts produced during (i) preparation, (ii) observation, (iii) microanalysis and (iv) sample storage are illustrated and discussed. The paper ends with recommendations on how minimize both preparation- and observation-induced artefacts, with specific mention to minerals.Keywords
This publication has 22 references indexed in Scilit:
- Clays in low-temperature environmentsPublished by Mineralogical Society ,2013
- Energy dispersive X-ray microanalysis by TEM applied to extraterrestrial materialsPublished by Mineralogical Society ,2013
- Transmission electron microscopy investigation of Ag-free lillianite and heyrovskyite from Vulcano, Aeolian Islands, ItalyAmerican Mineralogist: Journal of Earth and Planetary Materials, 2011
- Mineral chemistry and alteration of rare earth element (REE) carbonates from alkaline pegmatites of Mount Malosa, MalawiAmerican Mineralogist: Journal of Earth and Planetary Materials, 2009
- Measurement and estimation of temperature rise in TEM sample during ion millingUltramicroscopy, 2007
- The 6H-SiC structure model: Further refinement from SCXRD data from a terrestrial moissaniteAmerican Mineralogist: Journal of Earth and Planetary Materials, 2007
- High-resolution transmission electron microscopy (HRTEM) investigation of antigorite polysomes (m = 15 to 18)American Mineralogist: Journal of Earth and Planetary Materials, 2007
- Static-charging mitigation and contamination avoidance by selective carbon coating of TEM samplesUltramicroscopy, 2006
- HRTEM evidence for 8-reversals in the m = 17 antigorite polysomeAmerican Mineralogist: Journal of Earth and Planetary Materials, 2005
- Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogyEuropean Journal of Mineralogy, 2004