A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results

Abstract

X-ray scattering and diffraction phenomena are widely used as analytical tools in nanoscience. Size discrepancies between the two phenomena are commonly observed in crystalline nanoparticle systems. The root of the problem is that each phenomenon is affected by size distribution differently, causing contrasting shifts between the two methods. Once understood, the previously discrepant results lead to a simple formula for obtaining the nanoparticle size distribution.