Enhanced Preparation Technique of Plan-view Specimens for in situ TEM Heating Experiments based on the Synergy of Wedge-polishing and FIB
- 22 July 2022
- journal article
- Published by Oxford University Press (OUP) in Microscopy and Microanalysis
- Vol. 28 (S1), 2300-2301
- https://doi.org/10.1017/s1431927622008832
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Advanced preparation of plan-view specimens on a MEMS chip for in situ TEM heating experimentsMRS Bulletin, 2022
- Evolution of phases and their thermal stability in Ge–Sn nanofilms: a comprehensive in situ TEM investigationJournal of Alloys and Compounds, 2020
- Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stabilityUltramicroscopy, 2018