Indium–Gallium–Zinc Oxide Thin-Film Transistor-Based Scan Driver Circuit Using Separate Driving Structure for Multiple Output Signals

Abstract

This article proposes a scan driver circuit based on indium–gallium–zinc oxide (IGZO) thin-film transistors (TFTs) for multiple output signals. The proposed circuit could generate two overlapped output signals using a separate driving structure. The separate driving structure enabled the control nodes of each output signal to have a sufficiently high voltage during the output period. Consequently, the proposed circuit stably operated with the threshold voltage ( $\textit{V}_{\text{TH}}\text{)}$ varying from $-$ 3 to 4 V in the circuit simulation. The proposed scan driver circuit could reduce the circuit area because a single stage could output two output signals for two adjacent scan lines. Furthermore, the fabricated scan driver circuit exhibited a stable operation with multiple overlapped signals. Consequently, the proposed IGZO TFT-based scan driver circuit showed a stable circuit operation with multiple output signals through the separate driving structure.