A heuristic fault based optimization approach to reduce test vectors count in VLSI testing
Open Access
- 1 April 2019
- journal article
- research article
- Published by Elsevier BV in Journal of King Saud University - Computer and Information Sciences
- Vol. 31 (2), 229-234
- https://doi.org/10.1016/j.jksuci.2017.02.001
Abstract
No abstract availableKeywords
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