Subpixel measurements for unoccluded circular object in Machine Vision

Abstract

Automation in industries seeks measurement methods to be fast and accurate. Machine Vision makes measurements incredibly fast but accuracy is always argued upon. So, here is a novel and most simple approach for subpixel measurements; which will suffice the need for accuracy within defined limits by using local edge pixel intensities. Subpixel order of 20th was easily achieved i.e. measurements up to 20 times that of a pixel could be made. We achieved measurements up to 30 microns.