Fluorination of TiN, TiO2, and SiO2 Surfaces by HF toward Selective Atomic Layer Etching (ALE)

Abstract

As semiconductor devices become miniaturized, the importance of the molecular-level understanding of the fabrication processes is growing. Titanium nitride (TiN) is an important material utilized in various architectural components of semiconductor devices requiring precise control over size and shape. A reported process for atomic layer etching (ALE) of TiN involves surface oxidation into titanium oxide (TiO₂) and selective oxidized layer removal by hydrogen fluoride (HF). However, the chemical selectivity of these Ti-based materials in the etching process by HF remains unclear. In this study, computational chemistry methods utilizing density functional theory (DFT) calculations were applied to the fluorination reactions of TiN, TiO₂, and SiO₂ to identify and compare the surface chemical reactivity of these substrates toward etching processes. It is shown that the materials can be etched using HF, leaving TiF₄ and SiF₄ as the byproducts. However, while such a TiN reaction is thermodynamically hindered, the etching of TiO₂ and SiO₂ is suggested to be favorable. Our study provides theoretical insights into the fluorination reactivity of TiN, which has not been reported previously regardless of technological importance. Furthermore, we explore the etching selectivity between TiN, TiO₂, and SiO₂, which is a crucial factor in the ALE process conditions of TiN.