A novel method for resonant inelastic soft X-ray scatteringviaphotoelectron spectroscopy detection

Abstract
A method for measuring resonant inelastic X-ray scattering based on the conversion of X-ray photons into photoelectrons is presented. The setup is compact, relies on commercially available detectors, and offers significant flexibility. This method is demonstrated at the Linac Coherent Light Source with ∼0.5 eV resolution at the cobaltL3-edge, with signal rates comparable with traditional grating spectrometers.