An Initial Model for Zero Defect Manufacturing
Open Access
- 1 July 2020
- journal article
- research article
- Published by MDPI AG in Applied Sciences
- Vol. 10 (13), 4570
- https://doi.org/10.3390/app10134570
Abstract
This paper investigates an initial model for Zero Defect Manufacturing (ZDM) using a cost function where the operation and condition of a production process are reflected, and the quality of the output/product and the production process (as well as safety aspects) can be considered. The outset of the study is based on empirical data collected from five manufacturing companies, and proposes an initial model for ZDM with an Industry 4.0 perspective. The initial ZDM model has a generic setup for a real-life system and its replication as a digital twin using system models based on a representation of a generic production process with its connected control system, and potential interconnections between unit processes. It is based on concepts from system theory of dynamic systems and principles from condition monitoring and fault detection. In that way the model is deemed as highly generalizable for manufacturing and process industry companies as well as for some critical infrastructures with production and distribution systems. The proposed model with its cost function setup is analyzed and discussed in the context of ZDM. It is concluded that production processes in the manufacturing and process industry can be made more intelligent and interoperable using this approach. Improved sustainability, competitiveness, efficiency and profitability of companies are foreseen welcomed secondary effects. Finally, the proposed ZDM model further develops the ZDM by adding to it a systematic approach based on a solid mathematical foundation.This publication has 21 references indexed in Scilit:
- Prediction of service support costs for functional productsSimulation Modelling Practice and Theory, 2015
- A Cyber-Physical Systems architecture for Industry 4.0-based manufacturing systemsManufacturing Letters, 2015
- Automatic defect inspection system of colour filters using Taguchi-based neural networkInternational Journal of Production Research, 2013
- A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligenceInternational Journal of Production Research, 2013
- Determinants of eco-innovations by type of environmental impact — The role of regulatory push/pull, technology push and market pullEcological Economics, 2012
- Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafersInternational Journal of Production Research, 2011
- Organizing for Research and Action: Implementing Action Researcher NetworksSystemic Practice and Action Research, 2004
- Beyond TQM implementation: the new paradigm of TQM sustainabilityTotal Quality Management, 2002
- Model based control for a fine coal injection plantIEEE Control Systems, 1999
- Interconnected nonlinear systems, local and global stabilizationSystems & Control Letters, 1998