Resonance-mediated atomic ionization dynamics induced by ultraintense x-ray pulses

Abstract

We describe the methodology of our recently developed Monte Carlo rate equation (MCRE) approach, which systematically incorporates bound-bound resonances to model multiphoton ionization dynamics induced by high-fluence, high-intensity x-ray free-electron laser (XFEL) pulses. These resonances are responsible for ionization far beyond that predicted by the sequential single photon absorption model and are central to a quantitative understanding of atomic ionization dynamics in XFEL pulses. We also present calculated multiphoton ionization dynamics for Kr and Xe atoms in XFEL pulses for a variety of conditions, to compare the effects of bandwidth, pulse duration, pulse fluence, and photon energy. This comprehensive computational investigation reveals areas in the photon energy–pulse fluence landscape where resonances are critically important. We also uncover a mechanism, preservation of inner-shell vacancies (PIVS), whereby radiation damage is enhanced at higher XFEL intensities and identify the sequence of core-outer–Rydberg, core-valence, and core-core resonances encountered during multiphoton x-ray ionization.