Publisher's Note: “Hard x-ray photoemission study on strain effect in LaNiO3 thin films” [Appl. Phys Lett. 118, 161601 (2021)]
- 7 June 2021
- journal article
- correction
- Published by AIP Publishing in Applied Physics Letters
- Vol. 118 (23), 239902
- https://doi.org/10.1063/5.0055404
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Hard x-ray photoemission study on strain effect in LaNiO3 thin filmsApplied Physics Letters, 2021