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Scaling up quantum metrology for higher multiphoton resolution
Home
Publications
Scaling up quantum metrology for higher multiphoton resolution
Scaling up quantum metrology for higher multiphoton resolution
JF
Jodi Ackerman Frank
Jodi Ackerman Frank
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22 October 2021
other
Published by
AIP Publishing
in
Scilight
Vol. 2021
(43)
,
431105
https://doi.org/10.1063/10.0006879
Abstract
Efficient parametric down-conversion together with photon-number-resolving detection makes multiphoton quantum metrology robust and scalable.
Keywords
QUANTUM METROLOGY
CONVERSION
PARAMETRIC
EFFICIENT
RESOLUTION
RESOLVING
ROBUST
PHOTON